US Patent Issued to LG Chem on June 16 for "Coating thickness measuring apparatus and method" (South Korean Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,656,104, issued on June 16, was assigned to LG Chem Ltd. (Seoul, South Korea).

"Coating thickness measuring apparatus and method" was invented by Do-Hyun Lee (Daejeon, South Korea) and Seung-Heon Lee (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a coating thickness measuring apparatus and method.The coating thickness measuring apparatus according to an embodiment of the present disclosure includes a data obtaining unit configured to obtain thickness data indicating a thickness of a coating material applied to a contact portion of a substrate in contact with a coating roll while the substrate coated with the coating ma...