US Patent Issued to LEICA MICROSYSTEMS CMS on May 12 for "Microscope and method for microscopic examination of large samples" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,355, issued on May 12, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Microscope and method for microscopic examination of large samples" was invented by Werner Knebel (Kronau, Germany) and Florian Fahrbach (Mannheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope, which is a confocal microscope converted into a light sheet microscope, includes a microscope body and a mechanical receiving apparatus for microscope objectives, through which a microscope beam path extends. An optical module attachable to the receiving apparatus is configured to illuminate a sample volume and collect and transmit light from the samp...