US Patent Issued to LEICA MICROSYSTEMS CMS on May 12 for "Method for providing position information for retrieving a target position in a microscopic sample, method for examining and/or processing such a target position and means for implementing these methods" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,359, issued on May 12, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method for providing position information for retrieving a target position in a microscopic sample, method for examining and/or processing such a target position and means for implementing these methods" was invented by Frank Sieckmann (Wetzlar, Germany) and Frank Hecht (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for providing position information for retrieving a target position in a microscopic sample includes providing a first representation of the sample at a first resolution including the target position; specifying a first targe...