US Patent Issued to LEICA MICROSYSTEMS CMS on March 24 for "Maintenance prediction for modules of a microscope" (German Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,585,566, issued on March 24, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Maintenance prediction for modules of a microscope" was invented by Markus Weber (Wetzlar, Germany) and Stefan Bamberger (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A module for a microscope includes at least one sensor and/or at least one actuator, and a control and evaluation unit. The control and evaluation unit is configured to determine current parameter values of parameters of the sensor and/or of the actuator, analyze the parameter values using a statistical model stored in the control and evaluation unit to determine an operating s...