US Patent Issued to LEICA MICROSYSTEMS CMS on Feb. 17 for "Method and apparatus configured to count n-photon events" (German Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,770, issued on Feb. 17, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method and apparatus configured to count n-photon events" was invented by Holger Birk (Wetzlar, Germany), Frank Hecht (Wetzlar, Germany), Luis Alvarez (Wetzlar, Germany) and Bernd Widzgowski (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus is configured to count N-photon events within a time-dependent sequence of events of interactions of a plurality of photons with a light sensitive detector. The apparatus includes a signal-processing device and the light sensitive detector. An N-photon event represents an occurrence of at least N t...