US Patent Issued to Leica Instruments (Singapore) on Feb. 24 for "Microscope system and corresponding control system, method and computer program" (Singaporean Inventor)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,795, issued on Feb. 24, was assigned to Leica Instruments (Singapore) Pte. Ltd. (Singapore).

"Microscope system and corresponding control system, method and computer program" was invented by Gao Yang (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope system with a corresponding control system, method and computer program. The microscope system includes a microscope that generates images of a sample being arranged on a sample stage. The microscope system has a sample stage that carries the sample. The sample stage has a visual marker. The method uses an optical imaging sensor that provides image data of an image showing the visual...