US Patent Issued to LEENO INDUSTRIAL on March 3 for "Barrel for a test probe" (South Korean Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. D1,115,567, issued on March 3, was assigned to LEENO INDUSTRIAL INC. (Busan, South Korea).

"Barrel for a test probe" was invented by Chaeyoon Lee (Busan, South Korea), Seungha Baek (Busan, South Korea), Donghoon Park (Busan, South Korea) and Jinsik Son (Busan, South Korea).

The patent was filed on Oct. 1, 2024, under Application No. D/966,228.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1115567&OS=D1115567&RS=D1115567

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