US Patent Issued to Layer Metrics on July 21 for "Spectroferometer" (Delaware Inventor)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,430, issued on July 21, was assigned to Layer Metrics Inc. (Wilmington, Del.).

"Spectroferometer" was invented by Dominic Murphy (Wilmington, Del.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Spectroferometers and methods of use are provided. The spectroferometers includes an enclosure, one or more interferometer beam-splitting elements, and one or more spectrometer beam-dispersing elements. The one or more interferometer beam-splitting elements and the one or more spectrometer beam-dispersing elements are housed in the enclosure, share one or more radiation sensitive elements, which are arranged to generate a signal in response to incident electr...