ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,923, issued on Sept. 15, was assigned to KYOCERA Corp. (Kyoto, Japan).

"Observation apparatus and observation method" was invented by Atsushi Yoshikawa (Sagamihara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An observation apparatus includes a controller. The controller performs calibration based on a feature point set for a first region among the first region, a second region, and a third region and information on a position of the feature point in a real space. The controller acquires information on a position, in the real space, of a predetermined point in an observation region of a first sensor or an observation region of a second sen...