US Patent Issued to KOREA ELECTRONICS TECHNOLOGY INSTITUTE on May 19 for "Microplastic concentration measurement sensor and microplastic concentration measurement system using the same" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,597, issued on May 19, was assigned to KOREA ELECTRONICS TECHNOLOGY INSTITUTE (Seongnam-si, South Korea).

"Microplastic concentration measurement sensor and microplastic concentration measurement system using the same" was invented by Jin Hyoung Kim (Uiwang-si, South Korea), Kyu Sik Shin (Seoul, South Korea), Cheol Ung Cha (Seoul, South Korea) and Kwon Hong Lee (Seongnam-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Proposed are a microplastic concentration measurement sensor and a microplastic concentration measurement system using the sensor. The sensor may include a fluidic channel layer having a microfluidic channel formed on an ...