US Patent Issued to Korea Advanced Institute of Science and Technology on Sept. 22 for "System and method for high-resolution reflection tomographic imaging" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,630, issued on Sept. 22, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea).

"System and method for high-resolution reflection tomographic imaging" was invented by YongKeun Park (Daejeon, South Korea) and Herve Jerome Hugonnet (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a high-resolution reflection tomographic imaging system and method. The high-resolution reflection tomographic imaging system of the present disclosure may include an objective lens, a tube lens, a camera, an illumination element configured to introduce temporally coherent and spatially incoherent light, and...