US Patent Issued to KONINKLIJKE PHILIPS on Sept. 29 for "X-ray image analysis system, X-ray imaging system and method for analysing an X-ray image" (Indian, German Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,745,971, issued on Sept. 29, was assigned to KONINKLIJKE PHILIPS N.V. (Eindhoven, Netherlands).

"X-ray image analysis system, X-ray imaging system and method for analysing an X-ray image" was invented by Soubhik Paul (Kolkata, India), Biswaroop Chakrabarti (Kolkata, India), Sven Kroenke-Hille (Hamburg, Germany), Sudipta Chaudhury (Bangalore, India), Stewart Matthew Young (Hamburg, Germany) and Nataly Wieberneit (Hamburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to an X-ray image analysis system (4) comprising an X-ray image input interface (8) and a computing unit (9). The X-ray image input interface (8) is configure...