ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,348, issued on May 12, was assigned to Konica Minolta Inc. (Tokyo).
"Analysis apparatus, inspection system, and learning apparatus" was invented by Takehiko Sashida (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis apparatus includes: a hardware processor that: acquires image information items of a plurality of images regarding a target that are captured while the target is irradiated with light, extracts, based on the image information items, an image in which an irradiation region where the target is irradiated with the light and an inspection target region of the target have a predetermined relationship, from among the images, and ...