US Patent Issued to KONICA MINOLTA on July 28 for "Optical characteristic measuring apparatus, wavelength shift correcting apparatus, wavelength shift correction method, and program" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,161, issued on July 28, was assigned to KONICA MINOLTA INC. (Tokyo).

"Optical characteristic measuring apparatus, wavelength shift correcting apparatus, wavelength shift correction method, and program" was invented by Takashi Kawasaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wavelength of incident light is measured based on signals from a plurality of pixels of a photoelectric conversion element that are arranged in a dispersion direction in which the incident light is dispersed by a spectroscopic section. In correction of a shift in wavelength, a measured amount of shift in wavelength that is a difference between a measured value obt...