ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,410, issued on June 30, was assigned to KOKUSAI KEISOKUKI K.K. (Tokyo).
"Tire testing device" was invented by Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo) and Shuichi Tokita (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A tire testing device includes a vehicle, and a test unit provided in the vehicle and capable of supporting a test wheel on which a test tire is mounted in a state in which the test wheel is in contact with a road surface. The test unit includes a power unit configured to output power for rotationally driving the test wheel. The power unit includes a rotation output unit configured ...