ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,915, issued on July 14, was assigned to KOKUSAI KEISOKUKI K.K. (Tama, Japan).

"Tire testing device" was invented by Sigeru Matsumoto (Tokyo), Hiroshi Miyashita (Tokyo), Kazuhiro Murauchi (Tokyo) and Shuichi Tokita (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A tire testing device includes a road surface, and a carriage configured to rotatably hold a test wheel and traveling along the road surface. The carriage includes an alignment part configured to adjust wheel alignment of the test wheel. The alignment part includes a load adjusting part configured to adjust load acting on the test wheel. The load adjusting part includes a firs...