US Patent Issued to KOH YOUNG TECHNOLOGY, UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY on Nov. 3 for "Apparatus for three-dimensional shape measurement" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,121, issued on Nov. 3, was assigned to KOH YOUNG TECHNOLOGY INC (Seoul, South Korea) and UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea).

"Apparatus for three-dimensional shape measurement" was invented by Chul Min Joo (Goyang-si, South Korea) and Baek Cheon Seong (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional shape measurement apparatus, according to an embodiment, comprises: a projector configured to emit patterned light onto the object; and an imaging device configured to image the object, including an optical system, that includes at least one lens defining an optical axis and a...