US Patent Issued to KLA on July 14 for "Implementing image enhancement for improved defect detection" (Indian, British, Belgian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,441, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.).

"Implementing image enhancement for improved defect detection" was invented by Kaushik Sah (Kessel Lo, Belgium), Thirupurasundari Jayaraman (Chennai, India), Srikanth Kandukuri (Hyderabad, India), Andrew James Cross (Cheshire, Great Britain) and Gangadharan Sivaraman (Chennai, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for enhancing image quality. The system and method acquire a machine learning model trained for correlating one or more training images and one or more training design images. The system and method receive one or more sample specimen im...