ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,389, issued on Nov. 3, was assigned to KINSUS INTERCONNECT TECHNOLOGY CORP. (Taoyuan City, Taiwan).

"Test fixture" was invented by Ting-Hao Lin (Taoyuan City, Taiwan), Chiao-Cheng Chang (Taoyuan City, Taiwan) and Chien-Wei Chang (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test fixture includes a probe layer, a first resin layer, a first circuit layer, a second resin layer, a second circuit layer, a solder mask layer, and a bonding pad layer. The probe layer includes probes. The first resin layer is on the probe layer. The first circuit layer is on the first resin layer and connected to the probe layer. The second resin laye...