US Patent Issued to KEYSIGHT TECHNOLOGIES on Aug. 25 for "Systems and methods for measuring waveforms at devices under test" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,937, issued on Aug. 25, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Systems and methods for measuring waveforms at devices under test" was invented by Kenichi Takano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and computer readable media for measuring voltage and current waveforms at devices under test. An example method includes outputting an electrical signal from a signal generator of a measurement instrument; measuring a first voltage at an input to an output resistance of the measurement instrument; measuring a second voltage at an output of the output resistance of the measurement instrument; a...