US Patent Issued to JOEL, TOHOKU UNIVERSITY on May 12 for "X-ray spectrum analysis apparatus and method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,097, issued on May 12, was assigned to JOEL Ltd. (Tokyo) and TOHOKU UNIVERSITY (Sendai, Japan).

"X-ray spectrum analysis apparatus and method" was invented by Takanori Murano (Tokyo), Shogo Koshiya (Tokyo) and Masami Terauchi (Sendai, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A soft X-ray measurement device detects a characteristic X-ray emitted from a sample including a primary element and a secondary element. An X-ray spectrum generated by a spectrum generator includes a waveform of interest which is an intrinsic waveform of the primary element, caused by transition of electrons from a valence band to an inner shell in the primary elemen...