US Patent Issued to JMP Statistical Discovery on Sept. 15 for "Guided testing regime generation and selection" (North Carolina Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,737,690, issued on Sept. 15, was assigned to JMP Statistical Discovery LLC (Cary, N.C.).

"Guided testing regime generation and selection" was invented by Ryan Adam Lekivetz (Cary, N.C.), Joseph Albert Morgan (Raleigh, N.C.) and Jacob Davis Rhyne (Dallas, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a processor to: present a prompt to select a first pathway to traverse from among a set including a test-focused pathway of initial test-related parameter prompts followed by subsequent prompts for model-related or term-related parameters, a model-focused pathway of initial model-related parameter prompts followed by subsequent p...