US Patent Issued to JFE STEEL on Oct. 6 for "Quality abnormality analysis method, method of manufacturing metal material, and quality abnormality analysis device" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,536, issued on Oct. 6, was assigned to JFE STEEL Corp. (Tokyo).

"Quality abnormality analysis method, method of manufacturing metal material, and quality abnormality analysis device" was invented by Hiroyasu Shigemori (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quality abnormality analysis method for a product manufactured by a manufacturing process includes: predicting quality of the product by inputting manufacturing conditions to a quality prediction model generated by using a plurality of manufacturing conditions of the manufacturing process as input variables and using the quality of the product as an output variable; calculating a q...