US Patent Issued to JFE STEEL on Oct. 6 for "Abnormality determination apparatus, abnormality determination model generation method, and abnormality determination method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,542, issued on Oct. 6, was assigned to JFE STEEL Corp. (Tokyo).

"Abnormality determination apparatus, abnormality determination model generation method, and abnormality determination method" was invented by Takehide Hirata (Tokyo) and Kei Shomura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality determination apparatus: performs, during normal operation of the facility, K times of clipping from time-series signals indicating an operation state of the facility; sets M types as types of the time-series signals clipped by the time-series signal clipping unit, constructs an M-dimensional vector, and registers the constructed vector as ...