US Patent Issued to JF MICROTECHNOLOGY SDN. BHD. on May 5 for "Method for aligning contact pins in an integrated circuit testing apparatus" (Malaysian Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,899, issued on May 5, was assigned to JF MICROTECHNOLOGY SDN. BHD. (Petaling Jaya, Malaysia).

"Method for aligning contact pins in an integrated circuit testing apparatus" was invented by Wei Kuong Foong (Petaling Jaya, Malaysia), Kok Sing Goh (Petaling Jaya, Malaysia), Shamal Mundiyath (Petaling Jaya, Malaysia), Eng Kiat Lee (Petaling Jaya, Malaysia) and Caleb Lim (Petaling Jaya, Malaysia).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of aligning one or more rows of contact pins in an integrated circuit (IC) device testing apparatus that uses structures in bottom plates of the assembly itself to align rows of contact pins. Once a row of cont...