ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,578, issued on May 19, was assigned to JEOL Ltd. (Tokyo).
"Analyzing method and analyzer" was invented by Koki Kato (Tokyo), Shinya Fujita (Tokyo), Takanori Murano (Tokyo) and Shigeru Honda (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analyzing method using an analyzer including a wavelength-dispersive X-ray spectrometer that has an analyzing element to analyze an X-ray emitted from a specimen and detects an X-ray of energy corresponding to a position of the analyzing element. The analyzing method includes acquiring a plurality of map data by repeatedly performing a mapping analysis while changing the position of the analyzing element, th...