US Patent Issued to JEOL on March 24 for "Electron microscope and specimen orientation alignment method" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,752, issued on March 24, was assigned to JEOL Ltd. (Tokyo).

"Electron microscope and specimen orientation alignment method" was invented by Motofumi Saitoh (Tokyo) and Shuji Kawai (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electron microscope includes an irradiation optical system that irradiates a specimen with an electron beam, a specimen stage that supports the specimen, an image forming optical system that forms an image of electrons transmitted through the specimen, an imaging apparatus that captures an image formed by the image forming optical system, and a control unit that controls inclination of the specimen with respect to a...