US Patent Issued to JEOL on June 23 for "Charged particle beam source and charged particle beam system" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,158, issued on June 23, was assigned to JEOL Ltd. (Tokyo).

"Charged particle beam source and charged particle beam system" was invented by Kyouichi Kamino (Tokyo), Tomohisa Fukuda (Tokyo), Norikazu Arima (Tokyo), Yasuyuki Okano (Tokyo) and Keiichi Yamamoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a charged particle beam source having an emitter that can be replaced easily. The charged particle beam source includes an electron gun chamber; a first unit including both a supportive insulative member mechanically supporting a cable and a first set of terminals electrically connected to the cable; and a second unit including both...