US Patent Issued to JAPAN ELECTRONIC MATERIALS on July 14 for "Probe passing method and probe" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,046, issued on July 14, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan).

"Probe passing method and probe" was invented by Akihito Kurachi (Hyogo, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "[Problem] To facilitate passing of a probe through two or more guide plates. [Solution] Provided is a probe passing method for a probe card 1 in which two guide plates 301, 302 are spaced apart from each other, and a probe 50 is passed through two guide holes 311, 312 respectively formed in the two guide plates 301, 302, the method comprising: a step for passing a towing rod 60 through the two guide holes 311, 312; a step for separably li...