ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,789, issued on Aug. 25, was assigned to Japan Display Inc. (Tokyo).

"Detection device" was invented by Toshinori Uehara (Tokyo) and Fumihoru Nakano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a detection device including a sensor substrate including strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction. A curvature radius between a pair of adjacent strain sensors is calculated on a value from a preceding strain sensor of the pair of adjacent sensors. When a start point node is defined as a position of a first strain sensor at one end of the strain sensors, a relative ...