US Patent Issued to Japan Aerospace Exploration Agency on Sept. 22 for "Ionized material sample collection device and collecting method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,709, issued on Sept. 22, was assigned to Japan Aerospace Exploration Agency (Japan).

"Ionized material sample collection device and collecting method" was invented by Hajime Yano (Chofu, Japan), Yoshitsugu Sone (Chofu, Japan), Eiji Hosono (Tsukuba, Japan), Haruo Kishimoto (Tsukuba, Japan), Hirokazu Kitaura (Tsukuba, Japan), Daisuke Asakura (Tsukuba, Japan), Tomohiro Ishiyama (Tsukuba, Japan), Ayaka Takahashi (Chiba, Japan), Minoru Umeda (Nagaoka, Japan) and Sayoko Inagawa (Nagaoka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ionized material sample collection device according to the present invention includes one or a plurality of conta...