US Patent Issued to ISHIDA on March 31 for "X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,909, issued on March 31, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).

"X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatus" was invented by Kazuyuki Sugimoto (Ritto, Japan), Keisuke Yoshida (Ritto, Japan), Futoshi Yurugi (Ritto, Japan) and Osamu Hirose (Ritto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The X-ray inspection apparatus includes a conveying unit configured to convey an article, an X-ray source configured to irradiate the article conveyed by the conveying unit with X-rays, an X-ray detection unit capable of detecting the X-rays by photon counting, and an inspection unit configured to ...