US Patent Issued to ISHIDA on March 31 for "X-ray inspection apparatus, X-ray inspection system, and X-ray inspection method" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,906, issued on March 31, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).

"X-ray inspection apparatus, X-ray inspection system, and X-ray inspection method" was invented by Keisuke Yoshida (Ritto, Japan) and Futoshi Yurugi (Ritto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes a transport unit configured to transport an article, an electromagnetic wave irradiation unit configured to irradiate the article with a first electromagnetic wave in a first energy band a second electromagnetic wave in a second energy band, an electromagnetic wave sensor configured to detect the first electromagnetic wave and the s...