US Patent Issued to ION BEAM APPLICATIONS on March 17 for "Radiation measuring method, apparatus and device" (Belgian Inventor)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,485, issued on March 17, was assigned to ION BEAM APPLICATIONS SA (Louvain-la-Neuve, Belgium).

"Radiation measuring method, apparatus and device" was invented by Damien Prieels (Louvain-la-Neuve, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses a method for measuring and checking the irradiation of a product by a radiation source using a measuring device. After conveying the product in front of the radiation source, the radiation beam irradiates the front of the product and passes through to hit the at least two detectors, which are pointing to the same target zone of the radiation source by a collimator. Fina...