US Patent Issued to International Business Machines on May 12 for "Method for testing artificial intelligence units located across separate processing chips" (New York Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,788, issued on May 12, was assigned to International Business Machines Corp. (Armonk, N.Y.).

"Method for testing artificial intelligence units located across separate processing chips" was invented by Ali Y. Duale (Poughkeepsie, N.Y.) and Patrick Duffy (Poughkeepsie, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for testing artificial intelligence units (AIUs) located across separate processing chips is disclosed. The method provides the right test environment and test cases that stress remote AIU usages. The test cases include multiple machine instruction streams built to be executed on AIUs located on different processing chips. Thes...