ALEXANDRIA, Va., March 24 -- United States Patent no. 12,585,577, issued on March 24, was assigned to International Business Machines Corp. (Armonk, N.Y.).
"Reliability index in software testing" was invented by Vikas Chandra (Bangalore, India) and Sarika Sinha (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "Described are techniques for software test reliability characterization. The techniques include receiving a test failure for a software under development in an Integrated Development Environment (IDE). The techniques further include identifying, from a software testing repository communicatively coupled to the IDE, a similar failed software test. The techniques further include applying a...