US Patent Issued to Intelligent Memory on Nov. 3 for "Multiple tile wafer tester" (Chinese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,394, issued on Nov. 3, was assigned to Intelligent Memory Ltd. (Kwai Chung, Hong Kong).

"Multiple tile wafer tester" was invented by Peter Poechmueller (Jinan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A motherboard assembly for testing wafers is described. The motherboard assembly includes a probe card having a plurality of needles disposed in a center region and a plurality of micro connectors disposed outside the center region. Each micro connector is communicatively coupled with a plurality of needles. The motherboard assembly also includes a lower motherboard comprising a plurality of tiles, each tile having at least one processor and...