ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,384, issued on March 17, was assigned to Intel Corp. (Santa Clara, Calif.).
"Unified test and debug chiplet architecture" was invented by Sridhar Muthrasanallur (Bengaluru, India), Debendra Das Sharma (Saratoga, Calif.), Swadesh Choudhary (Mountain View, Calif.), Gerald Pasdast (San Jose, Calif.) and Peter Onufryk (Flanders, N.J.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Technologies for a unified debug and test architecture in chiplets is disclosed. In an illustrative embodiment, several chiplets are integrated on an integrated circuit package. The chiplets are connected by a package interconnect, such as a universal chiplet interconnect expr...