US Patent Issued to INTEGRAL GEOMETRY SCIENCE on Sept. 15 for "Inspecting device and inspecting method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,573, issued on Sept. 15, was assigned to INTEGRAL GEOMETRY SCIENCE INC. (Hyogo, Japan).

"Inspecting device and inspecting method" was invented by Shogo Suzuki (Hyogo, Japan), Yutaro Nishimura (Hyogo, Japan), Yuki Mima (Hyogo, Japan), Kenjiro Kimura (Hyogo, Japan) and Noriaki Kimura (Hyogo, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The inspecting device is an inspecting device that generates a spatial distribution image of an electric field, the inspecting device including: an electric field obtainer that measures the spatial distribution of the electric field at at least one measurement position determined relative to a scanning position...