ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,630, issued on March 17, was assigned to Instrumental Inc. (Palo Alto, Calif.).
"Modular optical inspection station" was invented by Samuel Bruce Weiss (Palo Alto, Calif.) and Anna-Katrina Shedletsky (Palo Alto, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-...