US Patent Issued to INSIDIX on Feb. 24 for "Method for performing topographic measurement and topographic measuring machine" (French Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,940, issued on Feb. 24, was assigned to INSIDIX (Noyarey, France).

"Method for performing topographic measurement and topographic measuring machine" was invented by Regis Braisaz (Reaumont, France) and Pierre Vernhes (Saint-Martin-d'Uriage, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A topographic measurement method includes provision of a sample including first surface provided with plurality of salient patterns. The first surface of the sample is illuminated by means of structured light that defines several repetitive patterns. The structured light is emitted at first angle with respect to first surface. A first image of first surface of...