US Patent Issued to Innolux on April 7 for "Detection device for evaluating internal electronic elements of a test object" (Taiwanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,140, issued on April 7, was assigned to Innolux Corp. (Miaoli County, Taiwan).

"Detection device for evaluating internal electronic elements of a test object" was invented by Chih-Yung Hsieh (Miaoli County, Taiwan) and Yan-Zheng Wu (Miaoli County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection device detects an output electromagnetic wave signal passing through a test object. The detection device includes an electromagnetic wave signal generating unit, an output element, a receiving element and a measuring unit. The electromagnetic wave signal generating unit is used for generating an initial electromagnetic wave signal. The outpu...