US Patent Issued to Infineon Technologies on July 14 for "Scanning electron microscopy-based sample analysis" (Austrian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,118, issued on July 14, was assigned to Infineon Technologies AG (Neubiberg, Germany).

"Scanning electron microscopy-based sample analysis" was invented by Maximilian Alexander Moser (Vienna), Gregor Bernhard Pobegen (Villach, Austria) and Michael Nelhiebel (Villach, Austria).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining sample information associated with a sample is provided. In an embodiment, when a sample has a first temperature, a first measure of electrons of the sample is determined. When the sample has a second temperature different than the first temperature, a second measure of electrons of the sample is determined. ...