US Patent Issued to Infineon Technologies Americas on Feb. 24 for "Dead-time calibration scheme for active clamp flyback (ACF) primary field-effect transistors (FET)" (Singaporean, Indian Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,650, issued on Feb. 24, was assigned to Infineon Technologies Americas Corp. (El Segundo, Calif.).

"Dead-time calibration scheme for active clamp flyback (ACF) primary field-effect transistors (FET)" was invented by Jojy Jose (Singapore), Soon Hwei Tan (Singapore), Hariom Rai (Bangalore, India) and Arun Khamesra (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method comprising controlling operation, by a secondary-side controlled Universal Serial Bus Power Delivery (USB-PD) alternating current to direct current (AC-DC) converter, a low-side field-effect transistor (FET). In response to controlling operation of the low-side FET, th...