US Patent Issued to Indian Institute Of Technology Madras (IIT Madras) on June 2 for "System and a method for detecting and characterizing a defect in an object using guided wave inspection" (Indian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,866, issued on June 2, was assigned to Indian Institute Of Technology Madras (IIT Madras) (Chennai, India).

"System and a method for detecting and characterizing a defect in an object using guided wave inspection" was invented by Krishnan Balasubramanian (Tamil Nadu, India) and Nived Suresh (Kannur, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of detecting and characterizing a defect in an object is described. The method comprises implementing comb-like pattern transducers upon the object to be tested, where each comb-like pattern transducer comprises array of source elements is periodically placed, selectively activating at least a ...