US Patent Issued to Imec vzw, Katholieke Universiteit Leuven on Aug. 4 for "Reinforcement learning (RL) based federated automated defect classification and detection" (Belgian Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,387, issued on Aug. 4, was assigned to Imec vzw (Leuven, Belgium) and Katholieke Universiteit Leuven (Leuven, Belgium).

"Reinforcement learning (RL) based federated automated defect classification and detection" was invented by Bappaditya Dey (Heverlee, Belgium), Enrique Dehaerne (Leuven, Belgium) and Sandip Halder (Bierbeek, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for training a local machine learning model is provided. The method includes receiving a scanning electron microscope (SEM) image of semiconductor features. The method additionally includes determining a location and dimensions of a bounding box within the SEM image...