US Patent Issued to HYUNDAI MOBIS on April 21 for "Device and method for defect inspection based on explainable artificial intelligence" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,602, issued on April 21, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea).

"Device and method for defect inspection based on explainable artificial intelligence" was invented by Tae Hyun Kim (Seoul, South Korea) and Jung Kyu Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An AI based defect inspecting device and method is disclosed. The present embodiment, in determining the good or defective product using the deep learning-based classification model based on an image of the product, provides a defect inspecting device and method for providing a basis for determining a good/defective product provided by a deep lear...