US Patent Issued to HYUNDAI MOBIS on April 14 for "Method and apparatus for detecting defect based on phased pass/fail determination" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,760, issued on April 14, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea).

"Method and apparatus for detecting defect based on phased pass/fail determination" was invented by Tae Hyun Kim (Seoul, South Korea), Yu Min Cho (Hwaseong-si, South Korea) and Kyu Ha Song (Hwaseong-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and an apparatus for detecting a defect based on a phased pass/fail determination are disclosed. According to at least one aspect of the present disclosure, a method comprising: a process of acquiring a product image which is an image of the product; a first determination process of inputting the p...