US Patent Issued to Huawei Technologies'Co., 'Ltd.' on Sept. 22 for "Measurement method, apparatus, and system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,745,108, issued on Sept. 22, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China).

"Measurement method, apparatus, and system" was invented by Zhongyi Shen (Beijing), Jing Han (Beijing), Li Zhang (Beijing) and Hong Li (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of this application provide a measurement method, an apparatus, and a system, so that when a time domain resource for layer 1 measurement and a configured time domain resource for layer 3 measurement overlap, the layer 1 measurement can be preferentially performed, thereby reducing a layer 1 measurement delay. The method includes: A terminal device obtains a fi...