US Patent Issued to Huawei Technologies'Co., 'Ltd.' on July 28 for "Wavelength measurement chip and wavelength measurement system" (Chinese, Japanese Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,163, issued on July 28, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China).

"Wavelength measurement chip and wavelength measurement system" was invented by Cheewei Lee (Shenzhen, China), Chao Pan (Shenzhen, China), Stevanus Darmawan (Chiba, Japan), Shaowu Wang (Dongguan, China), Qian Wang (Shenzhen, China) and Huaqiang Qin (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical chip and a wavelength measurement system are disclosed. The optical chip includes an optical splitter configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave sign...